Publications 2017
Conference Proceedings
- W. Xie, S. Hagemeier, J. Bischoff, R. Mastylo, E. Manske, P. Lehmann
Transfer characteristics of optical profilers with respect to rectangular edge and step height measurement
SPIE Proceedings 10329 (2017)
- S. Laubach, G. Ehret, J. Riebeling, P. Lehmann
Combination of a fast white-light interferometer with a phase shifting interferometric line sensor for form measurements of precision components
SPIE Proceedings 10329 (2017)
- S. Tereschenko, P. Lehmann, P. Gollor, P. Kühnhold
Vibration compensated high-resolution scanning white-light Linnik-interferometer
SPIE Proceedings 10329 (2017)
- S. Hagemeier, P. Lehmann
Multisensor-Messsystem zur Messung von Mikro- und Nanotopographien
XXXI. Messtechnisches Symposium des AHMT, Technisches Messen 84(s1) 2017
- J. Riebeling, P. Lehmann, S. Laubach, G. Ehret
Combination of a fast white-light interferometer with a phase shifting interferometric line sensor for form measurements of prescision components
59th IWK, Ilmenau Scientific Colloquium
Journals
- S. Laubach, G. Ehret, P. Lehmann, J. Riebeling
Interferometrischer Liniensensor zur Formmessung von rotationssymmetrischen optisch glatten Oberflächen
tm – Technisches Messen, 84 (2017) 166–173
- R. Montonen, A. Nolvi, S. Tereschenko, P. Kühnhold, P. Lehmann, E. Haeggström, I. Kassamakov
System spectrum conversion from white light interferogram
Optics Express 25 (2017) 12090-12099